Selected-area small-angle electron diffraction
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منابع مشابه
Selected-Area Small-Angle Electron Diffraction
Selected-area electron diffraction capable of resolving spacings up to 2000 ]k from first-order discrete reflections has been achieved using a standard, double-condenser electron microscope. The technique allows photographing of the selected area, at sufficient magnification, that gives rise to the small-angle scattering pattern, in addition to the normal capabilities of obtaining related wide-...
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Lattice parameters for gold nanocrystals, quartz, and vesuvianite have been determined by electron diffraction in routine transmission electron microscopy (TEM) work, with precision and accuracy near to 0.1%, after correction for elliptical distortion. The distortion, measured in three different microscopes, is constant for each microscope and may be easily eliminated. Variable camera constants...
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Electron tomography can provide three dimensional (3D) visualization of nanoscale objects in a transmission electron microscope (TEM) from a tilt series of projected images. The accuracy of the 3D reconstruction depends on quality of input parameters, including accurate alignment in real space and accuracy of tilt and azimuth angle measurements. Here we present an electron diffraction-based in-...
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This guide sheet outlines a method for the analysis of cubic crystal forms, this being useful to you for interpreting the transmission diffraction pattern produced by scattering electrons off a thin film target of polycrystalline aluminium. The apparatus also contains samples with hexagonal structures. These are pyrolytic graphite targets, and are available both as single crystals and in polycr...
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ژورنال
عنوان ژورنال: Journal of Materials Science
سال: 1967
ISSN: 0022-2461,1573-4803
DOI: 10.1007/bf00562952